Precision Attachment of (Silica) Spheres to AFM Cantilever Tips
نویسندگان
چکیده
منابع مشابه
Cantilever dynamics in AFM
Dynamic atomic force microscopy, in essence, consists of a vibrating microcantilever with a nanoscale tip that interacts with a sample surface via shortand long-range intermolecular forces. Microcantilevers possess several distinct eigenmodes and the tip-sample interaction forces are highly nonlinear. As a consequence, cantilevers vibrate in interesting, often unanticipated ways; some are detri...
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The resonant frequency and sensitivity of an atomic force microscope (AFM) cantilever with assembled cantilever probe (ACP) have been analyzed and a closed-form expression for the sensitivity of vibration modes has been obtained. The proposed ACP comprises an inclined cantilever and extension, and a tip located at the free end of the extension, which makes the AFM capable of topography at sidew...
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Here we report a universal method of attachment/functionalization of tips for atomic force microscope (AFM) with nanoparticles. The particles of interest are glued to the AFM tip with epoxy. While the gluing of micron size particles with epoxy has been known, attachment of nanoparticles was a problem. The suggested method can be used for attachment of virtually any solid nanoparticles. Approxim...
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Atomic force microscopy (AFM) can be combined with fluorescence microscopy to measure the changes in intracellular calcium levels (indicated by fluorescence of Ca²⁺ sensitive dye fluo-4) in response to mechanical stimulation performed by AFM. Mechanical stimulation using AFM is associated with cantilever movement, which may interfere with the fluorescence signal. The motion of the AFM cantileve...
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ژورنال
عنوان ژورنال: Microscopy Today
سال: 2001
ISSN: 1551-9295,2150-3583
DOI: 10.1017/s1551929500056960